SigmaQuest is the leader in on-demand scalable solutions for Product Quality Management. Our solution, SigmaSure, leverages a powerful root-cause analysis engine to improve product quality and customer satisfaction. Unlike home-grown systems and MES/ERP systems, SigmaSure is hardware and software agnostic - allowing you to automatically collect consistent data across the extended enterprise and perform detailed analysis on terabytes of parametric data.
News & Events
Successful Seminar Demonstrates Effective Test Strategies for Today’s Global Manufacturing Environme Print E-mail
NEW RELEASE – May 21, 2003 – National Instruments, a leader in virtual instrumentation, and SigmaQuest, a leader in product performance intelligence, held a joint seminar today in Sunnyvale, California. The seminar, “Making Global Manufacturing Test Flexible and Visible,” was attended by design, test, and manufacturing engineers and managers from more than fifteen (15) Silicon Valley companies.
Read more...
 
SigmaQuest Joins National Instruments Alliance Program Print E-mail
SigmaSure and NI TestStand Solve Global Manufacturing Test Challenge

NEWS RELEASE – May 13, 2003 – SigmaQuest, Inc., a leader in product performance intelligence, today announced joining National Instruments Alliance Program to provide an integrated solution that uses National Instruments TestStand™ and SigmaQuest’s SigmaSure. This integrated solution bridges the gap between design, manufacturing, and test in complex, global environments and helps customers build and ship quality products more quickly and at a lower cost.
Read more...
 
Seminar demonstrates benefits of integrating product performance intelligence with boundary-scan Print E-mail
NEWS RELEASE – April 23, 2003 -- More than 25 design, test and manufacturing companies attended a joint seminar in Sunnyvale, Calif. sponsored by ASSET InterTech, a leader in boundary-scan (IEEE 1149.1/JTAG) test and in-system programming (ISP), and SigmaQuest, Inc., a leader in product performance intelligence. The seminar was called “From Prototype to Profit” and it showcased integrated solutions for testing high-density printed circuit boards and managing test and diagnostics data across distributed design, manufacturing, and field organizations.
Read more...
 
More...
<< Start < Prev 1 2 3 4 Next > End >>

Results 70 - 81 of 81